Widok standardowy Widok MARC

International Conference on Defects Recognition, Imaging and Physics in Semiconductors (15 ; 2013 ; Warszawa). (Hasło imprezy/wydarzenia)

Liczba rekordów, w których użyto hasła: 1
Forma preferowana: International Conference on Defects Recognition, Imaging and Physics in Semiconductors (15 ; 2013 ; Warszawa).
Forma odrzucona:
  • Conference on Defects Recognition, Imaging and Physics in Semiconductors.
  • DRIP.
  • DRIP Conference.

Kp. Proceedings of the 15th International Conference on Defects Recognition, Imaging and Physics in Semiconductors [DRIP-XV] : Warsaw, Poland, September 15-19, 2013 / ed. of the proc. Janusz Kaniewski. - Warsaw, 2014.

Str. intern. Koferencji, 30.05.2014 http://www.ite.waw.pl/drip/index.php