Pozycja Hasło przedmiotowe

Liczba rekordów, w których użyto hasła: 10

001 - CONTROL NUMBER

• control field: 16164

003 - CONTROL NUMBER IDENTIFIER

• control field: POZN 31

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20251227173126.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 001003 ||a|znnbabn |a ana |c

010 ## - LIBRARY OF CONGRESS CONTROL NUMBER

• LC control number: s 00084252

040 ## - CATALOGING SOURCE

• Original cataloging agency: KR 93/LCh
• Subject heading/thesaurus conventions: kaba
• Transcribing agency: KR 93/LCh
• Modifying agency: KR 93/MK

083 #4 - DEWEY DECIMAL CLASSIFICATION NUMBER

• Classification number element-single number or beginning number of span: 530
• Explanatory term: Fizyka

150 ## - HEADING--TOPICAL TERM

• Topical term or geographic name entry element: Warstwy cienkie półprzewodnikowe.

450 ## - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: Couches minces semiconductrices [f]

450 ## - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: Semiconductor films [c]

450 00 - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: Półprzewodniki cienkowarstwowe.

450 00 - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: Półprzewodniki
• General subdivision: warstwy cienkie.

450 ## - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: Cienkie warstwy półprzewodnikowe.

550 ## - SEE ALSO FROM TRACING--TOPICAL TERM

• Control subfield: g
• Topical term or geographic name entry element: Półprzewodniki

550 ## - SEE ALSO FROM TRACING--TOPICAL TERM

• Control subfield: g
• Topical term or geographic name entry element: Warstwy cienkie (fizyka).

670 ## - SOURCE DATA FOUND

• Source citation: RAMEAU