Defects in semiconductors II :  symposium held November 1982 in Boston, Massachusetts, U.S.A. / 
ed.: Subhash Mahajan, James W. Corbett. 
 - New York :  North-Holland,  cop. 1983. 
 - XV, 582 s. :  il. ;  24 cm. 
 - Materials Research Society Symposia Proceedings,  vol. 14  0272-9172 ; .
 - Materials Research Society Symposia Proceedings  vol. 14 .
<br/><br/><label>ISBN: </label>0444008128 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Półprzewodniki--defekty--konferencje.
<br/><br/><label>Universal Decimal Class. No.: </label>548.4(061.3)  537.311.33(061.3)