Characterization of epitaxial semiconductor films / 
ed. by Henry Kressel. 
 - Amsterdam :  Elsevier,  1976. 
 - XII, 216 s. :  il. ;  25 cm. 
 - Methods and Phenomena : their applications in science and technology ;  vol. 2 .
 - Methods and Phenomena  vol. 2 .
<br/><br/> This set of papers has been published as a special issue of Thin Solid Films, vol. 31, issues 1 and 2. 
<br/><br/><label>ISBN: </label>044441438X 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Epitaksja.<br/>Warstwy cienkie półprzewodnikowe.
<br/><br/><label>Universal Decimal Class. No.: </label>621.315.592.3