Eberhart, Jean-Pierre. <br/><br/>
Structural and chemical analysis of materials :  x-ray, electron and neutron diffraction ; x-ray, electron and ion spectrometry ; electron microscopy / 
 X-ray, electron and neutron diffraction  X-ray, electron and ion spectrometry  Electron microscopy Tytuł oryginału:  Analyse structurale et chimique des matériaux 
J. P. Eberhart ; translated by J. P. Eberhart. 
 - Chichester :  John Wiley & Sons,  1991. 
 - XXX, 545 strony :  ilustracje ;  26 cm. 
<br/><br/>Bibliografia przy rozdziałach. Indeks. 
<br/><br/><label>ISBN: </label>0471950149 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Mikroskopia chemiczna
<br/><br/><label>Index Terms--Curriculum Objective: </label><br/>Chemia<br/>Inżynieria i technika