TY  - BOOK
AU  - Eberhart,Jean-Pierre
ED  - John Wiley & Sons.
TI  - Structural and chemical analysis of materials: x-ray, electron and neutron diffraction ; x-ray, electron and ion spectrometry ; electron microscopy 
SN  - 0471950149
PY  - 1991///
CY  - Chichester
PB  - John Wiley & Sons
KW  - Mikroskopia chemiczna
KW  - DBN
KW  - Chemia
KW  - Inżynieria i technika
N1  - Bibliografia przy rozdziałach. Indeks
UR  - https://library.put.poznan.pl/spisy_tresci/237353.pdf
ER  -