Siegel, Benjamin M. <br/><br/>
Modern developments in electron microscopy / 
edited by Benjamin M. Siegel. 
 - New York ;  London :  Academic Press,  1964. 
 - XIII, 432 s. :  il. ;  23 cm. 
<br/><br/>Bibliogr. przy rozdz. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Mikroskopia elektronowa.
<br/><br/><label>Universal Decimal Class. No.: </label>621.385.833