Applied scanning probe methods XI :  scanning probe microscopy techniques / 
Bharat Bhushan, Harald Fuchs (eds.). 
 - Berlin ;  Heidelberg :  Springer-Verlag,  2009. 
 - LV, 235 s. :  il. kol. ;  24 cm. 
 - Nanoscience and Technology,  1434-4904 .
 - Nanoscience and Technology .
<br/><br/>Bibliogr. przy rozdz. Indeks. 
<br/><br/>
<br/><br/><label>ISBN: </label>9783540850366 9783540850373 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materiały--mikroskopia.<br/>Mikroskopia sondy skaningowej.
<br/><br/><label>Universal Decimal Class. No.: </label>621.385.833 620.186