Computed electron micrographs and defect identification / 
A. K. Head [et al.]. 
 - Amsterdam ;  London :  New York :  North-Holland Publishing Company ;  American Elsevier Publishing Company,  cop. 1973. 
 - X, 400 s. :  il. ;  23 cm. 
 - Defects in Crystalline Solids  vol. 7 .
 - Defects in Crystalline Solids  vol. 7 .
<br/><br/>Bibliogr. s. 387-389. Indeks. 
<br/><br/><label>ISBN: </label>0720417570 0444104623 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Mikroskopia elektronowa--informatyka.<br/>Metale--defekty--informatyka.