TY  - BOOK
AU  - Head,A.K.
TI  - Computed electron micrographs and defect identification
T2  - Defects in Crystalline Solids
SN  - 0720417570
PY  - 1973///
CY  - Amsterdam, London, New York
PB  - North-Holland Publishing Company, American Elsevier Publishing Company
KW  - Mikroskopia elektronowa
KW  - informatyka
KW  - kaba
KW  - Metale
KW  - defekty
N1  - Bibliogr. s. 387-389. Indeks
ER  -