Nökel, Klaus. <br/><br/>
Temporally distributed symptoms in technical diagnosis / 
K. Nökel. 
 - Berlin :  Springer,  1991. 
 - IX, 164 s. ;  24 cm. 
 - Lecture Notes in Computer Science. Lecture Notes in Artificial Intelligence .
 - Lecture Notes in Computer Science  517 Lecture Notes in Computer Science.  Lecture Notes in Artificial Intelligence .
<br/><br/> Ser. gł.: Lecture Notes in Computer Science ; 517. 
<br/><br/>Bibliogr. s. 157-162. 
<br/><br/>
<br/><br/><label>ISBN: </label>3540543163 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Systemy ekspertowe (informatyka).<br/>Wykrywanie uszkodzeń (inżynieria).