| 000 | 00728cam a2200265 i 4500 | ||
|---|---|---|---|
| 001 | to2003029399 | ||
| 005 | 20251228125805.0 | ||
| 008 | 030326s III||||| |||||00| ||eng|| | ||
| 020 | _a0070542732 | ||
| 040 | _aPOZN 31/MS | ||
| 041 | 0 | _aeng | |
| 080 | _a621.315.592 | ||
| 100 | 1 |
_aRunyan, W. R. _924742 |
|
| 245 | 0 | 0 |
_aSemiconductor measurements and instrumentation / _cW.R. Runyan. |
| 260 |
_aNew York : _bMcGraw-Hill, _c1975. |
||
| 300 |
_a280 s. : _bil. ; _c26 cm. |
||
| 440 | 0 |
_aTexas Instruments Electronic Series _923417 |
|
| 500 | _aIndeks. | ||
| 504 | _aBibliogr. s. 268-274. | ||
| 650 | 0 | 0 |
_aPółprzewodniki _9199904 |
| 999 |
_c15892 _d15892 |
||