| 000 | 00526cam a2200169 i 4500 | ||
|---|---|---|---|
| 005 | 20251228114116.0 | ||
| 008 | 990305s | ||
| 040 | _aP 30 | ||
| 041 | 0 | _aeng | |
| 080 | _a539.1/.2 | ||
| 245 | 0 | 0 |
_aMaterial Charakterization Using Ion Beams / _cEd. Thomas J.P. [i inn.]. |
| 260 |
_aLondon : _bPlenum Press, _c1978. |
||
| 300 |
_aXVIII,517 s.,bibliogr. ; _c30 cm. |
||
| 500 | _aNATO Advanced Study Institutes Series .Ser.B:Physics. Vol.28. | ||
| 700 | 1 |
_aThomas J.P. _eRed. _9203456 |
|
| 999 |
_c6291 _d6291 |
||