| 000 | 01121cam a2200313 i 4500 | ||
|---|---|---|---|
| 001 | zz2006969869 | ||
| 003 | NUKAT | ||
| 005 | 20251228161715.0 | ||
| 008 | 060619s1988 xxua f |000 0deng c | ||
| 020 | _a081868786X | ||
| 035 | _a(OCoLC)1412981725 | ||
| 040 |
_aKIEL 008/JK _cKIEL 008/JK _dKIEL 008/JS |
||
| 080 |
_a621.38 _a681.3 |
||
| 100 | 1 |
_aAgrawal, Vishwani D. _d(1943- ). _984592 |
|
| 245 | 1 | 0 |
_aTutorial test generation for VLSI CHIPS / _cVishwani D. Agrawal and Sharad C. Seth. ; IEEE Computer Society. |
| 246 | 3 | 0 | _aTest generation for VLSI CHIPS |
| 260 |
_aWashington : _bComputer Society Press ; _aLos Angeles : _bComputer Society, _ccop. 1988. |
||
| 300 |
_aX, 401 s. : _bil. ; _c29 cm. |
||
| 336 | _aTekst | ||
| 337 | _aBez urządzenia pośredniczącego | ||
| 338 | _aWolumin | ||
| 504 | _aBibliogr. przy ref. oraz na s. 333-394. | ||
| 536 | _aFinansowane przez Test Technology Technical Committee. | ||
| 650 | 7 |
_aUkłady VLSI. _2kaba _99885 |
|
| 700 | 1 |
_aSeth, Sharad C. _984593 |
|
| 920 | _a0-8186-8786-X | ||
| 999 |
_c64230 _d64230 |
||